Double k 1 probe rail bottom detection method

The rail bottom flaw detection method of double k 1 probe is as follows:

1, the rail bottom adopts K-type flaw detection method, combined probes are placed on both sides of the rail bottom respectively, and the combined probes of six machines and six receivers correspond to each other one by one, which can realize the damage detection of the rail bottom section. Rail bottom flaw detection is the same as rail head K flaw detection, so the defect location and damage display can refer to rail head flaw detection.

2. Because the rail bottom is the most seriously damaged part, and the width of the rail bottom is larger than the rail head, in order to strengthen the detection of the rail bottom, the number of chips of the combined probe is increased from 6 to 12, forming two groups of probes with 6 engines and 6 receivers.

3. In this way, the rail bottom probe can be regarded as a combination of two groups of rail bottom probes: the first group of rail bottom probes (referred to as rail bottom I) consists of six pairs of wafers, namely, a transmitting probe and a receiving probe. The second set of rail bottom probes (referred to as rail bottom II for short) consists of six pairs of wafers, namely the transmitting probe and the receiving probe. Using this 12 chip two-in-one rail bottom probe can improve the scanning density of weld flaw detection, which is beneficial to prevent the weld damage at the rail bottom from being missed.